CARACTERIZACIÓN DE PELÍCULAS DELGADAS MEDIANTE EL DIFRACTOMETRO X'Pert-PRO PANalytical CARACTERIZATION OF THIN FILMS BY X'Pert-PRO PANalytical DIFRACTOMETER
In this work, the structural characterization of thin films using a conventional diffraction equipment, brand X'Pert PRO PANalytical X-rays is described. A brief review of the theoretical diffraction techniques and X-ray reflectivity is included. In the experimental
