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Study of linear strain gauges at micron scale for the reduction of external factors

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Abstract:

Abstract In the present article, the design and simulation of a strain gauge is shown, which serves to measure deformation or pressure in different applications of the industry. In this way, the respective simulation was carried out in the COMSOL Multiphysics 5.2 software, where the 3 linear meander gauge was subjected to external factors such as temperature and pressure, with this, the different results obtained were shown the mechanical behavior and of Graphene and Silver grid materials and substrate Paper. On the other hand, in front of the design of the three-way linear strain gauge, M.E.M.S (Micro-electromechanical Systems) parameters technology was used to reduce its dimensions in micrometers to reduce the effects of the respective external factors where these produce errors in the measurements.

Tópico:

Advanced MEMS and NEMS Technologies

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Información de la Fuente:

SCImago Journal & Country Rank
FuenteIOP Conference Series Materials Science and Engineering
Cuartil año de publicaciónNo disponible
Volumen844
Issue1
Páginas012032 - 012032
pISSNNo disponible
ISSN1757-899X

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