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FuenteJournal of Electronic Testing | Cuartil año de publicaciónNo disponible | Volumen36 |
Issue1 | Páginas47 - 57 | pISSNNo disponible |
ISSN0923-8174 | Perfil OpenAlexhttps://openalex.org/S200807567 | |
| Minciencias ID | ART-0000499625-104 | Scienti ID | 0000499625-104 | Pdf URL | http://rua.ua.es/dspace/bitstream/10045/105452/5/Serrano-Cases_etal_2020_JElectronTest_preprint.pdf |
|---|---|---|---|---|---|
| Scholar citations URL | https://scholar.google.com/scholar?cites=13707393401877589111&as_sdt=2005&sciodt=0,5&hl=en | Scholar URL | https://scholar.google.com/scholar?hl=en&as_sdt=0%2C5&q=info%3Ad2xyk6xxOr4J%3Ascholar.google.com&btnG= | Openalex URL | https://openalex.org/W2994962807 |
| Doi URL | https://doi.org/10.1007/s10836-019-05846-4 | Open_access URL | https://rua.ua.es/dspace/bitstream/10045/105452/5/Serrano-Cases_etal_2020_JElectronTest_preprint.pdf | ||
