Abstract The paper presents experimental study of IR absorbance of the thin TiO film (with the thickness of 600 nm) on the glass substrate. The titanium monoxide (TiO) film was prepared with the ion-beam scattering. The film was characterized by XRD, FTIR, SEM etc. IR absorption spectra for the film and the substrate were measured. It was shown that the average absorbance Ā of the pure glass substrate is Ā ≈ 0.08 in the wavelength range λ = 2.5 … 15 μ m. For the TiO film it was obtained that Ā ≈ 0.38 in the same λ range.