Abstract The analysis of the impact of the variation of the substrate and the geometric characteristics of the cells basic that make up a metamaterial, as well as their frequency response, bandwidth and insertion losses level of the bandgap generated, is presented. A metamaterial in microstrip transmission line technology was simulated and manufactured on two dielectric substrates with different relative permittivity index, introducing electromagnetic band gap structures (EBG) in the ground plane. Five geometrical shapes were selected for the cells of the EBG structure. The response of the metamaterial is analyzed on the characteristics of the band gap, varying the lattice constant, the size and the geometry of the cells (defects) and the substrate used. The results obtained show that this type of devices can be used to measure the properties of elements by detecting the change of the refractive index of the metamaterial, with frequency selectivity. The study of these parameters is critical for the applications of metamaterials in filters, sensors and actuators, among others.