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FuenteJournal of Electronic Testing | Cuartil año de publicaciónNo disponible | Volumen35 |
Issue1 | Páginas87 - 100 | pISSNNo disponible |
ISSN0923-8174 | Perfil OpenAlexhttps://openalex.org/S200807567 | |
| Scienti ID | 0000154828-18 | Minciencias ID | ART-0000154828-18 | Doi URL | https://doi.org/10.1007/s10836-019-05772-5 |
|---|---|---|---|---|---|
| Openalex URL | https://openalex.org/W2911263012 | Scholar URL | https://scholar.google.com/scholar?hl=en&as_sdt=0%2C5&q=info%3AmzvcjzXdfHIJ%3Ascholar.google.com&btnG= | Scholar citations URL | https://scholar.google.com/scholar?cites=8249711839552486299&as_sdt=2005&sciodt=0,5&hl=en |
