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FuenteMicroelectronics Reliability | Cuartil año de publicaciónNo disponible | Volumen88-90 |
IssueNo disponible | Páginas903 - 908 | pISSNNo disponible |
ISSN0026-2714 | Perfil OpenAlexhttps://openalex.org/S133646729 | |
| Scienti ID | 0000499625-92 | Minciencias ID | ART-0000499625-92 | Scholar URL | https://scholar.google.com/scholar?hl=en&as_sdt=0%2C5&q=info%3Asv-3ldWJvQUJ%3Ascholar.google.com&btnG= |
|---|---|---|---|---|---|
| Scholar citations URL | https://scholar.google.com/scholar?cites=413638291220856754&as_sdt=2005&sciodt=0,5&hl=en | Pdf URL | https://rua.ua.es/dspace/bitstream/10045/81569/5/2018_Isaza-Gonzalez_etal_MicroelectronicsReliability_preprint.pdf | Openalex URL | https://openalex.org/W2895518944 |
| Doi URL | https://doi.org/10.1016/j.microrel.2018.07.008 | Open_access URL | https://rua.ua.es/dspace/bitstream/10045/81569/5/2018_Isaza-Gonzalez_etal_MicroelectronicsReliability_preprint.pdf | ||
