An electronic system was designed to acquire tunneling current of a Scanning Tunneling Microscope. A tunneling current originates from the interaction between a conductive tip and a conductive or semiconductor sample. Lower currents than 100 nA were generated and from them, voltages were obtained in the order of 1 volt. Using this mechanism, it is possible to construct images of the atoms positions on the surface of the sample, also other properties of the materials can be studied.