We describe a novel technique that we call tilt scanning interferometry to measure depth-resolved structure and displacement fields within semi-transparent scattering materials. The method differs significantly from conventional optical coherence tomography, in that only one wavelength is used throughout the whole measurement process. Temporal sequences of speckle interferograms are recorded while the illumination angle is tilted at constant rate. Fourier transformation of the resulting three-dimensional intensity distribution along the time axis reconstructs the scattering potential within the medium. Repeating the measurements with the object wave at equal and opposite angles about the observation direction results in two three-dimensional phase-change volumes, the sum of which gives the out-of-plane-sensitive phase volume and the difference between which gives the in-plane phase volume. From these phase-change volumes the in-plane and out-of-plane depth-resolved displacement fields are obtained. The theoretical framework for the technique is explained in detail and a practical optical implementation is described. Finally, results from proof-of-principle experiments involving a semi-transparent beam undergoing bending are presented.