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FuenteJournal of Electronic Testing | Cuartil año de publicaciónNo disponible | Volumen28 |
Issue2 | Páginas189 - 200 | pISSNNo disponible |
ISSN0923-8174 | Perfil OpenAlexhttps://openalex.org/S200807567 | |
| Minciencias ID | ART-0000172820-39 | Scienti ID | 0000172820-39 | Scienti ID | 0000233579-27 |
|---|---|---|---|---|---|
| Scholar URL | https://scholar.google.com/scholar?hl=en&as_sdt=0%2C5&q=info%3AgsqjWD2qIAIJ%3Ascholar.google.com&btnG= | Scienti URL | http://www.springerlink.com/content/140142102176887t/fulltext.pdf?MUD=MP | Doi URL | https://doi.org/10.1007/s10836-012-5287-2 |
| Scholar citations URL | https://scholar.google.com/scholar?cites=153309567787453058&as_sdt=2005&sciodt=0,5&hl=en | Openalex URL | https://openalex.org/W2149084796 | ||
