X-ray powder diffraction measurements, at room temperature, and magnetic susceptibility χ measurements, in the temperature range from 2 to 300 K, were made on polycrystalline samples of Cu2FeGeSe4 and Cu2FeGeTe4 magnetic semiconductor compounds. Magnetization measurements at 2, 4.2 and 77 K in magnetic fields up to 35 T were carried out on Cu2FeGeSe4 compounds. From the analysis of the X-ray diffraction lines, it was found that Cu2FeGeSe4 and Cu2FeGeTe4 have, respectively, stannite and monoclinic structures. The resulting 1/χ versus T curves showed that Cu2FeGeSe4 is antiferromagnetic with a Néel temperature TN= 20 K while Cu2FeGeSe4 is ferrimagnetic with TN = 160.1 K. The magnetization and susceptibility results obtained on Cu2FeGeSe4 showed the presence of bound magnetic polarons (BMPs) in agreement with earlier studies made on this type of materials [1, 2].