In this work, we report a study of the temperature dependence of magnetotransport properties for a series of [AF-LCMO (7.6nm)/F-LCMO (t <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">F</sub> )] <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">N</sub> superlattices. Superlattices of F-LCMO and AF-LCMO layers were grown on (001)-oriented SrTiO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> substrates via a high-pressure dc sputtering process. The modulation period have been experimentally derived from X-ray diffraction measurements, confirming that for all superlattices actual layer thicknesses were within 10% of the nominal values. A high resolution transmission electron microscopy micrograph of a superlattice showing sharp interfaces with interfacial roughness value around 0.38 nm. Atomic force microscopy (AFM) images of the 190 nm-total thickness multilayer show surface roughness below 10 nm. Several properties associated with CMR and exchange bias effects have been studied in F-LCMO/AF-LCMO multilayers.