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FuenteIEEE Transactions on Reliability | Cuartil año de publicaciónNo disponible | Volumen62 |
Issue1 | Páginas66 - 72 | pISSNNo disponible |
ISSN0018-9529 | Perfil OpenAlexhttps://openalex.org/S87725633 | |
| Scienti ID | 0000076813-8630 | Minciencias ID | ART-0000076813-8630 | Scholar URL | https://scholar.google.com/scholar?hl=en&as_sdt=0%2C5&q=info%3AZSlJoq6jmlIJ%3Ascholar.google.com&btnG= |
|---|---|---|---|---|---|
| Doi URL | https://doi.org/10.1109/tr.2013.2241193 | Openalex URL | https://openalex.org/W2099781737 | Open_access URL | https://arxiv.org/pdf/1208.1327 |
| Scholar citations URL | https://scholar.google.com/scholar?cites=5952249827965872485&as_sdt=2005&sciodt=0,5&hl=en | ||||