Droplets presence has been studied in TiN hard coatings produced by pulsed vacuum arc plasma assisted physical vapor deposition when the parameters of the process have been varied. The droplets identification was by atomic force microscopy (AFM) using the high deviation that produces the droplet presence in the average roughness of the coating as criteria. It has been observed a strongly dependence of the droplets presence with the voltage and the distance between electrodes. It seems to be the discharge number does not affect strongly the macroparticle presence. The novel method based in AFM is appropriate for real analysis of very small particles.