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FuenteJournal of Electronic Testing | Cuartil año de publicaciónNo disponible | Volumen27 |
Issue4 | Páginas505 - 516 | pISSNNo disponible |
ISSN0923-8174 | Perfil OpenAlexhttps://openalex.org/S200807567 | |
| Scienti ID | 0000172820-274 | Minciencias ID | ART-0000172820-274 | Scienti ID | 0000233579-28 |
|---|---|---|---|---|---|
| Scholar URL | https://scholar.google.com/scholar?hl=en&as_sdt=0%2C5&q=info%3Ay4bxciCmgJ8J%3Ascholar.google.com&btnG= | Doi URL | https://doi.org/10.1007/s10836-011-5219-6 | Open_access URL | https://iris.polito.it/bitstream/11583/2413924/2/2413924.pdf |
| Scholar citations URL | https://scholar.google.com/scholar?cites=11493368907347101387&as_sdt=2005&sciodt=0,5&hl=en | Openalex URL | https://openalex.org/W2078257297 | Scienti URL | http://link.springer.com/article/10.1007%2Fs10836-011-5219-6#page-1 |
| Pdf URL | https://core.ac.uk/download/pdf/11420365.pdf | ||||
