Homogeneous, highly conductive, and transparent silver nanowire thin films were fabricated using a simple dip‐coating technique and a subsequent annealing step. Silver nanowires with two different average lengths (11 μ m and 19 μ m) were used in the sample preparation to analyze the dependence of the sheet resistance on the length of the one‐dimensional nanostructures. The best sample had a sheet resistance of 10.2 Ω /□ with optical transmittance of 89.9%. Two figures of merit, the electrical to optical conductivity ratio ( σ DC / σ OP ) and ϕ TC , were obtained for all the samples in order to measure their performance as transparent conductive materials.