For a optics and spectroscopy laboratory that generated plasma from a lasers systems, it is important to know in detail the shape of the intensity distribution in the spot of the laser, for that reason it performed the characterization of the radiation from lasers CW (continuous) gas, solid state and semiconductor, where experimentally obtained information of the intensity distribution of the beam, the measurement of the radius of the spot, the beam profile and divergence of the same from a diagnostic device that is based on a CCD sensor. Images were obtained from Spot of the lasers by said sensor and were processed and analyzed by 2 dimensional graphs that yielded information on the intensity profile of the radiation optic lasers and also be presented the spot shape in detail, in order to ensure the quality of the laser systems and can select lasers devices that are capable of performing highly accurate experimental researches which have significant scientific or simply can perform ablation procedures without risk of affecting the material.