Mott type variable range hopping conduction (VRH) below 50 K has been observed in several samples of CuInTe2. This set of data and those published earlier on CuInSe2 and Si:B are used to check the validity over an extended range of T/TX towards high temperature of the scaling expression of the form ρ = ρ0 exp [Af(T/TX)] as proposed by Aharony et al. It is confirmed that all data including that of CdSe fall on a universal curve. From the knowledge of the parameters A and TX, one can get a better estimate of the critical temperature Tc in each sample, related to the crossover from Mott to Efros-Shklovskii type conduction.