Three commercially available passive organic vapor monitoring badges were exposed to ethyl benzene vapor in a dynamic test atmosphere characterized by well defined square wave concentration profiles having periods of 2, 6, and 10 minutes. These concentration fluctuations between zero and 150 ppm caused no significant bias in the TWA concentration indicated by the badges. A slight, but statistically significant, interaction between badge type and exposure profile is attributable to random analytical error in the data provided by one badge type.
