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FuenteJournal of Electronic Testing | Cuartil año de publicaciónNo disponible | Volumen31 |
Issue2 | Páginas139 - 150 | pISSNNo disponible |
ISSN0923-8174 | Perfil OpenAlexhttps://openalex.org/S200807567 | |
| Minciencias ID | ART-0000499625-59 | Scienti ID | 0000499625-59 | Open_access URL | https://rua.ua.es/dspace/bitstream/10045/58375/5/2015_Restrepo_etal_JElectronTest_rev.pdf |
|---|---|---|---|---|---|
| Pdf URL | https://rua.ua.es/dspace/bitstream/10045/58375/5/2015_Restrepo_etal_JElectronTest_rev.pdf | Scholar URL | https://scholar.google.com/scholar?hl=en&as_sdt=0%2C5&q=info%3AyPfPh0guLi8J%3Ascholar.google.com&btnG= | Openalex URL | https://openalex.org/W2031559749 |
| Doi URL | https://doi.org/10.1007/s10836-015-5513-9 | Scholar citations URL | https://scholar.google.com/scholar?cites=3399705657762379720&as_sdt=2005&sciodt=0,5&hl=en | ||
