The physical properties of the ternary compound Ag2GeSe3 have been scarcely studied. In this work we present the complete characterization of this material synthesized by direct melting of the constituent elements in their stoichiometric ratios inside evacuated quartz ampoules. The characterization was performed using ATD, EDX, TEM and X-ray diffraction techniques. The thermograms show the existence of a single phase at 574 °C. From the EDX analysis a stoichiometric ratio of Ag: 1.42 (±2.97%), Ge: 1.23 (±3.32%) and Se: 3.35 (±0.92%) is obtained. X-ray analysis indicates that the compound crystallizes in the monoclinic system with cell parameters of a = 7.7516(1) Å, b = 10.874(4) Å, c = 7.318(1) Å, β= 115.82(1)°. The TEM analysis is not conclusive yet about the crystalline system and cell parameters.