An insulating YBa2Cu3O7-δ (YBCO) thin film was grown by inverted cylindrical magnetron (ICM) sputtering and under nitrogen cooling instead of oxygen in situ annealing. This insulating film went through different annealing processes in flowing oxygen, each time with increasing annealing temperature. The resistivity as a function of temperature was measured after each annealing. The fluctuation conductivity σ′(T) is determined from the resistivity data and an analysis of the possible mechanisms for scattering of the fluctuating pairs is presented in this work. The crystal structure of the film through these different steps is also reported.