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Magnetic resonance in the Zn1−xMnxIn2Se4dilute magnetic semiconductor system

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Abstract:

An electron paramagnetic resonance (EPR) study of the Mn concentration and temperature in the range of 4 K ≤T≤300 K for the dilute semimagnetic semiconductor Zn1−xMnxIn2Se4 is reported. The EPR spectra were measured for the concentrations 0.01<x<1.0. For low Mn content the spectrum contains multiple resonances at g = 2, g~3 and g~5. The behaviour of the g = 2 signal linewidth ΔHpp as a function of temperature was studied and it was related to the fitting parameters at the critical temperature and the Curie point. The j parameter of the modified expression of Silva was obtained and its role is shown for the particular transition of this system.

Tópico:

Chalcogenide Semiconductor Thin Films

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Citations: 7
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Información de la Fuente:

SCImago Journal & Country Rank
FuenteJournal of Physics Condensed Matter
Cuartil año de publicaciónNo disponible
Volumen17
Issue17
Páginas2755 - 2762
pISSNNo disponible
ISSN1361-648X

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