Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Paulo Orozco, Daniel Acuña, Fabio Chaparro, Joaquín Riveros; Design and performance of a reflectometer to measure optical properties of multilayer optical thin films. AIP Conf. Proc. 1 July 1996; 378 (1): 667–671. https://doi.org/10.1063/1.51176 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioAIP Conference Proceedings Search Advanced Search |Citation Search